High-precision atomic force microscopy with atomically-characterized tips
Traditionally, atomic force microscopy (AFM) experiments are conducted at tip–sample distances where the tip strongly interacts with the surface. This increases the signal-to-noise ratio, but poses the problem of relaxations in both tip and sample that hamper the theoretical description of experimen...
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| Autori principali: | , , , , |
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| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
IOP Publishing
2020-01-01
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| Serie: | New Journal of Physics |
| Soggetti: | |
| Accesso online: | https://doi.org/10.1088/1367-2630/ab8efd |
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