High-precision atomic force microscopy with atomically-characterized tips
Traditionally, atomic force microscopy (AFM) experiments are conducted at tip–sample distances where the tip strongly interacts with the surface. This increases the signal-to-noise ratio, but poses the problem of relaxations in both tip and sample that hamper the theoretical description of experimen...
Gorde:
| Egile Nagusiak: | , , , , |
|---|---|
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
IOP Publishing
2020-01-01
|
| Saila: | New Journal of Physics |
| Gaiak: | |
| Sarrera elektronikoa: | https://doi.org/10.1088/1367-2630/ab8efd |
| Etiketak: |
Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!
|