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Direct Observation of Sr Vacancies in SrTiO_{3} by Quantitative Scanning Transmission Electron Microscopy

Unveiling the identity, spatial configuration, and microscopic structure of point defects is one of the key challenges in materials science. Here, we demonstrate that quantitative scanning transmission electron microscopy (STEM) can be used to directly observe Sr vacancies in SrTiO_{3} and to determ...

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Bibliografiset tiedot
Päätekijät: Honggyu Kim, Jack Y. Zhang, Santosh Raghavan, Susanne Stemmer
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: American Physical Society 2016-12-01
Sarja:Physical Review X
Linkit:http://doi.org/10.1103/PhysRevX.6.041063
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