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Direct Observation of Sr Vacancies in SrTiO_{3} by Quantitative Scanning Transmission Electron Microscopy

Unveiling the identity, spatial configuration, and microscopic structure of point defects is one of the key challenges in materials science. Here, we demonstrate that quantitative scanning transmission electron microscopy (STEM) can be used to directly observe Sr vacancies in SrTiO_{3} and to determ...

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書誌詳細
主要な著者: Honggyu Kim, Jack Y. Zhang, Santosh Raghavan, Susanne Stemmer
フォーマット: Artigo
言語:Inglês
出版事項: American Physical Society 2016-12-01
シリーズ:Physical Review X
オンライン・アクセス:http://doi.org/10.1103/PhysRevX.6.041063
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