A single-event transient tolerant bandgap reference utilizing dual-modular-redundant (DMR) technique

—Bandgap reference (BG) is a crucial component commonly adopted in analog and mixed-signal systems. BG is vulnerable in space applications, which can lead to signal degradation and even subsequent module failure when subjected to heavy-ion strikes. This paper firstly proposes a radiation-hardened-by...

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Principais autores:	Jingtian Liu, Jianyang Wang, Lin Deng, Hongliang Lyu, Dongsheng Wang, Shi Xu, Deng Luo
Formato:	Artigo
Idioma:	Inglês
Publicado:	Elsevier 2026-07-01
Series:	Nuclear Engineering and Technology
Assuntos:	Bandgap reference Radiation-hardened-by-design (RHBD) Single-event transient (SET) Dual modular redundancy (DMR)
Acceso en liña:	http://www.sciencedirect.com/science/article/pii/S1738573326001543
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