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ANNEALING EFFECT ON VIBRATION MODES OF ALUMINUM NITRIDE THIN FILMS

Reactive magnetron sputtering was used to prepare aluminum nitride (AlN) films at an intermediate substrate temperature of 450 ºC. In order to analyze the microstructure and vibrational phonon modes of AlxNy and AlmOn clusters, the sample was subjected to thermal annealing in a controlled nitrogen a...

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Detalles Bibliográficos
Principais autores: Roberto Bernal Correa, Mario E. Rodríguez-García, Álvaro Pulzara Mora
Formato: Artigo
Idioma:Inglês
Publicado: Universidad Nacional de Colombia 2014-01-01
Series:Momento
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Acceso en liña:https://revistas.unal.edu.co/index.php/momento/article/view/48041
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