Modeling of MoS2/Si heterostructure to study charge transfer dynamics
Here, we synthesized a MoS _2 /Si heterojunction device using a scalable approach involving DC sputtering coupled with sulfurization. The observed current–voltage characteristics unequivocally indicate a rectifying behavior at MoS _2 /Si heterointerface. To quantitatively assess the carrier dynamics...
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| Autori principali: | , , |
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| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
IOP Publishing
2024-01-01
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| Serie: | Nano Express |
| Soggetti: | |
| Accesso online: | https://doi.org/10.1088/2632-959X/ad4a96 |
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