A Refined Quasi‐Static Method for Precise Determination of Piezoelectric Coefficient of Nanostructured Standard and Inclined Thin Films

Abstract Piezoelectric materials are key components for applications including non‐destructive testing, medical imaging, energy harvesting, ultrasonic sensors, and actuators. Among different materials exhibiting piezoelectricity, crystalline thin films are proposed as alternative candidates to repla...

ver descrição completa

Detalhes bibliográficos

Principais autores:	Manuel Pelayo Garcia, Desmond Gibson, Dave Allan Hughes, Carlos Garcia Nuñez
Formato:	Artigo
Idioma:	Inglês
Publicado em:	Wiley-VCH 2024-03-01
Colecção:	Advanced Physics Research
Assuntos:	Berlincourt piezoelectric materials quasi‐static method thin films zinc oxide
Acesso em linha:	https://doi.org/10.1002/apxr.202300091
Tags:	Adicionar Tag Sem tags, seja o primeiro a adicionar uma tag!