A Refined Quasi‐Static Method for Precise Determination of Piezoelectric Coefficient of Nanostructured Standard and Inclined Thin Films
Abstract Piezoelectric materials are key components for applications including non‐destructive testing, medical imaging, energy harvesting, ultrasonic sensors, and actuators. Among different materials exhibiting piezoelectricity, crystalline thin films are proposed as alternative candidates to repla...
Furkejuvvon:
| Váldodahkkit: | , , , |
|---|---|
| Materiálatiipa: | Artigo |
| Giella: | Inglês |
| Almmustuhtton: |
Wiley-VCH
2024-03-01
|
| Ráidu: | Advanced Physics Research |
| Fáttát: | |
| Liŋkkat: | https://doi.org/10.1002/apxr.202300091 |
| Fáddágilkorat: |
Eai fáddágilkorat, Lasit vuosttaš fáddágilkora!
|