The Fingerprints of Resonant Frequency for Atomic Vacancy Defect Identification in Graphene
The identification of atomic vacancy defects in graphene is an important and challenging issue, which involves inhomogeneous spatial randomness and requires high experimental conditions. In this paper, the fingerprints of resonant frequency for atomic vacancy defect identification are provided, base...
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| Principais autores: | , , |
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| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
MDPI AG
2021-12-01
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| Serier: | Nanomaterials |
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| Online adgang: | https://www.mdpi.com/2079-4991/11/12/3451 |
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