Detect, Classify, and Locate Faults in DC Microgrids Based on Support Vector Machines and Bagged Trees in the Machine Learning Approach

The DC microgrids possess numerous pros, including enhanced reliability, increased efficiency, and a less complicated control system. Further, they provide a simplified system that facilitates the incorporation of renewable energy sources (RES), battery storage systems, and DC loads. DC microgrids i...

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Auteurs principaux:	Mohammed H. Ibrahim, Ebrahim A. Badran, Mansour H. Abdel-Rahman
Format:	Artigo
Langue:	Inglês
Publié:	IEEE 2024-01-01
Collection:	IEEE Access
Sujets:	LVDC microgrid protection solid fault to ground fault location fault localization machine learning
Accès en ligne:	https://ieeexplore.ieee.org/document/10689405/
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