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Detect, Classify, and Locate Faults in DC Microgrids Based on Support Vector Machines and Bagged Trees in the Machine Learning Approach

The DC microgrids possess numerous pros, including enhanced reliability, increased efficiency, and a less complicated control system. Further, they provide a simplified system that facilitates the incorporation of renewable energy sources (RES), battery storage systems, and DC loads. DC microgrids i...

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Principais autores: Mohammed H. Ibrahim, Ebrahim A. Badran, Mansour H. Abdel-Rahman
Format: Artigo
Sprog:Inglês
Udgivet: IEEE 2024-01-01
Serier:IEEE Access
Fag:
LVDC microgrid
protection
solid fault to ground
fault location
fault localization
machine learning
Online adgang:https://ieeexplore.ieee.org/document/10689405/
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