Improved atomic force microscopy cantilever performance by partial reflective coating
Optical beam deflection systems are widely used in cantilever based atomic force microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the detector side to increase the reflectivity in order to achieve a high signal on the photodiode. Although the reflective coating is usu...
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| Glavni autori: | , , , |
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| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
Beilstein-Institut
2015-07-01
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| Serija: | Beilstein Journal of Nanotechnology |
| Teme: | |
| Online pristup: | https://doi.org/10.3762/bjnano.6.150 |
| Oznake: |
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