Low-temperature AFM with a microwave cavity optomechanical transducer
We demonstrate atomic force microscopy (AFM) imaging with a microcantilever force transducer where an integrated superconducting microwave resonant circuit detects cantilever deflection using the principles of cavity optomechanics. We discuss the detector responsivity and added noise, pointing to it...
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| Auteurs principaux: | , , , , , , |
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| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
Beilstein-Institut
2025-10-01
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| Collection: | Beilstein Journal of Nanotechnology |
| Sujets: | |
| Accès en ligne: | https://doi.org/10.3762/bjnano.16.130 |
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