Polymer surface structures determined using ToF-SIMS
This article reviews the recent applications of time-of-flight secondary ion mass spectrometry in the determination of surface structures of semicrystralline and amorphous polymer films. Examples given include the determination of end-group distributions on semicrystalline polymer surfaces, lamellar...
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| Hlavní autoři: | , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
De Gruyter
2014-03-01
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| Edice: | Reviews in Analytical Chemistry |
| Témata: | |
| On-line přístup: | https://doi.org/10.1515/revac-2013-0015 |
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