3D/4D imaging of complex and deformed microstructures with pink-beam dark field X-ray microscopy

Abstract Dark Field X-ray Microscopy (DFXM) has advanced 3D non-destructive, high-resolution imaging of strain and orientation in crystalline materials, enabling the study of embedded structures in bulk. However, the photon-hungry nature of monochromatic DFXM limits its applicability for studying hi...

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Hlavní autoři:	Can Yildirim, Aditya Shukla, Yubin Zhang, Nikolas Mavrikakis, Louis Lesage, Virginia Sanna, Marilyn Sarkis, Yaozhu Li, Michela La Bella, Carsten Detlefs, Henning Friis Poulsen
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	Nature Portfolio 2025-08-01
Edice:	Communications Materials
On-line přístup:	https://doi.org/10.1038/s43246-025-00926-9
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