A miniature X-ray diffraction setup on ID20 at the European Synchrotron Radiation Facility

We describe an ultra-compact setup for in situ X-ray diffraction on the inelastic X-ray scattering beamline ID20 at the European Synchrotron Radiation Facility. The main motivation for the design and construction of this setup is the increasing demand for on-the-fly sample characterization, as well...

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Hlavní autoři:	Christoph J. Sahle, Marta Majkut, Kari O. Ruotsalainen, Florent Gerbon, Noora Suomalainen, Marie-Claire Lagier, Blanka Detlefs, Laurent Claustre, Alessandro Mirone, Alessandro Longo
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	International Union of Crystallography 2024-11-01
Edice:	Journal of Synchrotron Radiation
Témata:	x-ray diffraction inelastic x-ray scattering sample characterization radiation damage
On-line přístup:	https://journals.iucr.org/paper?S1600577524009147
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