Modeling of the Electrical Characteristics and Degradation Mechanisms of UV-C LEDs

In this paper we investigate the reliability of AlGaN-based UV-C LEDs with an emission wavelength of 265 nm. By submitting the devices to constant current stress, two main electrical degradation processes are identified: a turn-on voltage shift and an increase in the forward leakage current. In part...

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Autors principals:	Nicola Roccato, Francesco Piva, Carlo De Santi, Matteo Buffolo, Normal Susilo, Daniel Hauer Vidal, Anton Muhin, Luca Sulmoni, Tim Wernicke, Micheal Kneissl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Format:	Artigo
Idioma:	Inglês
Publicat:	IEEE 2024-01-01
Col·lecció:	IEEE Photonics Journal
Matèries:	UV-C Light-Emitting Diodes Trap-assisted tunneling (TAT) degradation modeling defects
Accés en línia:	https://ieeexplore.ieee.org/document/10404031/
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