Atomic Force Microscope Study of Ag-Conduct Polymer Hybrid Films: Evidence for Light-Induced Charge Separation

Scanning Kelvin probe microscopy (SKPM), electrostatic force microscopy (EFM) are used to study the microscopic processes of the photo-induced charge separation at the interface of Ag and conductive polymers, i.e., poly[2,6-(4,4-bis-(2-ethylhexyl)-4<i>H</i>-cyclopenta[2,1-b;3,4-bʹ]dithiophene)-alt-4...

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Detalhes bibliográficos

Principais autores:	Yinghui Wu, Dong Wang, Jinyuan Liu, Houzhi Cai, Yueqiang Zhang
Formato:	Artigo
Idioma:	Inglês
Publicado em:	MDPI AG 2020-09-01
coleção:	Nanomaterials
Assuntos:	SKPM EFM conductive polymers interface
Acesso em linha:	https://www.mdpi.com/2079-4991/10/9/1819
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