Atomic Force Microscope Study of Ag-Conduct Polymer Hybrid Films: Evidence for Light-Induced Charge Separation
Scanning Kelvin probe microscopy (SKPM), electrostatic force microscopy (EFM) are used to study the microscopic processes of the photo-induced charge separation at the interface of Ag and conductive polymers, i.e., poly[2,6-(4,4-bis-(2-ethylhexyl)-4<i>H</i>-cyclopenta[2,1-b;3,4-bʹ]dithiophene)-alt-4...
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| Huvudupphov: | , , , , |
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| Materialtyp: | Artigo |
| Språk: | Inglês |
| Utgiven: |
MDPI AG
2020-09-01
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| Serie: | Nanomaterials |
| Ämnen: | |
| Länkar: | https://www.mdpi.com/2079-4991/10/9/1819 |
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