Phase measuring profilometry based on binary encoded frequency modulation grating projection
The impact of the system nonlinear on measuring accuracy of three-step phase-shifting measuring profilometry with the traditional sinusoidal frequency modulated grating projection is discussed. A binary encoded sinusoidal frequency modulated grating is used to improve the accuracy of absolute phase...
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| Principais autores: | , , |
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| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
Editorial Department of Journal of Sichuan University (Natural Science Edition)
2017-01-01
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| Serier: | 四川大学学报. 自然科学版 |
| Fag: | |
| Online adgang: | http://science.scu.edu.cn/thesisDetails?columnId=45830127&Fpath=home&index=0 |
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