Phase measuring profilometry based on binary encoded frequency modulation grating projection

The impact of the system nonlinear on measuring accuracy of three-step phase-shifting measuring profilometry with the traditional sinusoidal frequency modulated grating projection is discussed. A binary encoded sinusoidal frequency modulated grating is used to improve the accuracy of absolute phase...

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Bibliografske podrobnosti

Principais autores:	GUO Yu-Fan, CHEN Wen-Jing, SU Xian-Yu
Format:	Artigo
Jezik:	Inglês
Izdano:	Editorial Department of Journal of Sichuan University (Natural Science Edition) 2017-01-01
Serija:	四川大学学报. 自然科学版
Teme:	Phase measuring profilometry Binary frequency modulated grating Binary encoded grating template Absolute phase
Online dostop:	http://science.scu.edu.cn/thesisDetails?columnId=45830127&Fpath=home&index=0
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