Monte Carlo method in optical atomic force microscopy
Scanning probe microscopy（SPM） is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. Atomic force microscopy is one of the SPM family which is considered as a very versatile tool for surface imaging and measurements. A wide range of various samples c...
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| Format: | Artigo |
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| Sprog: | Inglês |
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Publishing Center of North University of China
2021-01-01
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| Serier: | Journal of Measurement Science and Instrumentation |
| Fag: | |
| Online adgang: | http://jmsi.publish.founderss.cn/thesisDetails?columnId=47035638&Fpath=home&index=0 |
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