Application of Areal Topography Parameters in Surface Characterization
This review paper provides a comprehensive overview of selected 3D surface texture parameters defined by ISO 25178-2, with a focus on their metrological aspects in high-resolution measurements using atomic force microscopy (AFM). The parameters <i>Sa</i>, <i>Sz</i>, <i>Sq</i>, <i>Sdq</i>, and <i>Sdr...
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| Autores principales: | , , , , , |
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| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
MDPI AG
2025-06-01
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| Colección: | Applied Sciences |
| Materias: | |
| Acceso en línea: | https://www.mdpi.com/2076-3417/15/12/6573 |
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