Application of Areal Topography Parameters in Surface Characterization

This review paper provides a comprehensive overview of selected 3D surface texture parameters defined by ISO 25178-2, with a focus on their metrological aspects in high-resolution measurements using atomic force microscopy (AFM). The parameters <i>Sa</i>, <i>Sz</i>, <i>Sq</i>, <i>Sdq</i>, and <i>Sdr...

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Autors principals:	Vesna Alar, Andrej Razumić, Biserka Runje, Ivan Stojanović, Marin Kurtela, Branko Štrbac
Format:	Artigo
Idioma:	Inglês
Publicat:	MDPI AG 2025-06-01
Col·lecció:	Applied Sciences
Matèries:	surface texture characterization areal topography parameters atomic force microscopy (AFM) measurement uncertainty instrument calibration
Accés en línia:	https://www.mdpi.com/2076-3417/15/12/6573
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