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Effects of detection-beam focal offset on back-focal-plane displacement detection

High-resolution displacement detection can be achieved by analyzing the scattered light of the trapping beams from the particle in optical tweezers. In some applications where trapping and detecting beams must be separated, a detecting beam can be introduced for independent displacement measurement....

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Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Prif Awduron: Anni Chen, Guofeng Li, Hui Luo, Zhijie Chen, Haining Feng, Tengfang Kuang, Hui an, Xiang Han, Wei Xiong, Guangzong Xiao
Fformat: Artigo
Iaith:Inglês
Cyhoeddwyd: AIP Publishing LLC 2024-04-01
Cyfres:AIP Advances
Mynediad Ar-lein:http://dx.doi.org/10.1063/5.0203136
Tagiau: Ychwanegu Tag
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