Effects of detection-beam focal offset on back-focal-plane displacement detection
High-resolution displacement detection can be achieved by analyzing the scattered light of the trapping beams from the particle in optical tweezers. In some applications where trapping and detecting beams must be separated, a detecting beam can be introduced for independent displacement measurement....
Tallennettuna:
| Päätekijät: | , , , , , , , , , |
|---|---|
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
AIP Publishing LLC
2024-04-01
|
| Sarja: | AIP Advances |
| Linkit: | http://dx.doi.org/10.1063/5.0203136 |
| Tagit: |
Ei tageja, Lisää ensimmäinen tagi!
|