A Fast Method for Lifetime Estimation of Blue Light-Emitting Diode Chips Based on Nonradiative Recombination Defects
This paper proposes a new method for estimating the lifetime of the InGaN/GaN-based light-emitting diode (LED) chip by analysing the density of nonradiative recombination defects. The nonradiative recombination defect is a major factor affecting the performance of LED chips, and the increase...
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| Auteurs principaux: | , |
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| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
IEEE
2017-01-01
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| Collection: | IEEE Photonics Journal |
| Sujets: | |
| Accès en ligne: | https://ieeexplore.ieee.org/document/7929262/ |
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