Quantitative wear evaluation of tips based on sharp structures
To comprehensively study the influence of atomic force microscopy (AFM) scanning parameters on tip wear, a tip wear assessment method based on sharp structures is proposed. This research explored the wear of AFM tips during tapping mode and examined the effects of scanning parameters on estimated ti...
Gorde:
| Egile Nagusiak: | , |
|---|---|
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Beilstein-Institut
2024-02-01
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| Saila: | Beilstein Journal of Nanotechnology |
| Gaiak: | |
| Sarrera elektronikoa: | https://doi.org/10.3762/bjnano.15.22 |
| Etiketak: |
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