Measurement of thermoelectric parameters of thin-film semiconductor materials using the Harman method

For the analysis of the measurement of thermoelectric parameters of semiconductors, the Harman pulsed method was used. The authors propose a new approach to determine the thermoelectric quality factor of thin semiconductor films in the temperature interval (300 ÷ 500) K by directly measuring a serie...

पूर्ण विवरण

ग्रंथसूची विवरण

मुख्य लेखकों:	Y. V. Tur, Y. V. Pavlovskyi, I. S. Virt
स्वरूप:	Artigo
भाषा:	Inglês
प्रकाशित:	Vasyl Stefanyk Carpathian National University 2019-10-01
श्रृंखला:	Фізика і хімія твердого тіла
विषय:	thin films lead telluride thermoelectric quality factor the harman method pulsed-laser deposition.
ऑनलाइन पहुंच:	http://journals.pu.if.ua/index.php/pcss/article/view/3974
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