Reflectometers for Absolute and Relative Reflectance Measurements in the Mid-IR Region at Vacuum

We demonstrated spectral reflectometers for two types of reflectances, absolute and relative, of diffusely reflecting surfaces in directional-hemispherical geometry. Both are built based on the integrating sphere method with a Fourier-transform infrared spectrometer operating in a vacuum. The third...

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Detalhes bibliográficos

Principais autores:	Jinhwa Gene, Min Yong Jeon, Sun Do Lim
Formato:	Artigo
Idioma:	Inglês
Publicado em:	MDPI AG 2021-02-01
coleção:	Sensors
Assuntos:	mid-infrared total reflectance metrology primary standard 3rd Taylor method
Acesso em linha:	https://www.mdpi.com/1424-8220/21/4/1169
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