Dark-probe scanning near-field microscopy
Scanning near-field optical microscopy (SNOM) is a well-known powerful optical technique for visualization of surface nanostructures and fields far beyond the diffraction limit and thus indispensable in material- and nanoscience. While the SNOM resolution is theoretically unlimited, the SNOM perform...
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| Principais autores: | , , , |
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| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
IOP Publishing
2023-01-01
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| Serier: | New Journal of Physics |
| Fag: | |
| Online adgang: | https://doi.org/10.1088/1367-2630/acfdc5 |
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