Dark-probe scanning near-field microscopy
Scanning near-field optical microscopy (SNOM) is a well-known powerful optical technique for visualization of surface nanostructures and fields far beyond the diffraction limit and thus indispensable in material- and nanoscience. While the SNOM resolution is theoretically unlimited, the SNOM perform...
Gardado en:
| Principais autores: | , , , |
|---|---|
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
IOP Publishing
2023-01-01
|
| Series: | New Journal of Physics |
| Assuntos: | |
| Acceso en liña: | https://doi.org/10.1088/1367-2630/acfdc5 |
| Tags: |
Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!
|