EBGS-YOLOv5: A Lightweight Insulator Defect Detection Algorithm for Complex Inspection Scenarios

To address occlusion, multi-scale variations, and the susceptibility of small objects to false positives and missed detections during inspection in complex scenarios, an EBGS-YOLOv5 insulator defect detection algorithm is proposed based on the YOLOv5s network. First, the Efficient Channel Attention...

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Hlavní autoři:	Dan Li, Tianxiang Ma, Da Zhang, Yanpeng Ji, Shiwei Xue, Zengxu Zhao
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	IEEE 2026-01-01
Edice:	IEEE Access
Témata:	Insulator defect detection C3ECA module BiFPN Ghost convolution SIOU
On-line přístup:	https://ieeexplore.ieee.org/document/11598904/
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