Two-Dimensional Quantum Material Identification via Self-Attention and Soft-Labeling in Deep Learning
Detecting two-dimensional (2D) materials in silicon chips presents a significant challenge in the field of quantum machines due to the difficulty of data collection. Specifically, among thousands of flakes, not all flakes are useful or well-annotated, resulting in noisy and hard samples within the d...
I tiakina i:
| Ngā kaituhi matua: | , , , , , |
|---|---|
| Hōputu: | Artigo |
| Reo: | Inglês |
| I whakaputaina: |
IEEE
2024-01-01
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| Rangatū: | IEEE Access |
| Ngā marau: | |
| Urunga tuihono: | https://ieeexplore.ieee.org/document/10684707/ |
| Ngā Tūtohu: |
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
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