Two-Dimensional Quantum Material Identification via Self-Attention and Soft-Labeling in Deep Learning

Detecting two-dimensional (2D) materials in silicon chips presents a significant challenge in the field of quantum machines due to the difficulty of data collection. Specifically, among thousands of flakes, not all flakes are useful or well-annotated, resulting in noisy and hard samples within the d...

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Hlavní autoři:	Xuan Bac Nguyen, Apoorva Bisht, Benjamin Thompson, Hugh Churchill, Khoa Luu, Samee U. Khan
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	IEEE 2024-01-01
Edice:	IEEE Access
Témata:	Quantum material 2D flake detection deep learning computer vision identification
On-line přístup:	https://ieeexplore.ieee.org/document/10684707/
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