STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION
In this paper, symmetrical CMOS OTA degradation is investigated with using statistical methods. OTA’ s are degraded using 4155 parameter analyzer and output current change is observed. An appopriate fitting curve is realised with MATLAB programme by taking into consedaration the error. Lifetime of t...
I tiakina i:
| Ngā kaituhi matua: | , , |
|---|---|
| Hōputu: | Artigo |
| Reo: | Inglês |
| I whakaputaina: |
İstanbul University-Cerrahpasa
2008-03-01
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| Rangatū: | Electrica |
| Ngā marau: | |
| Urunga tuihono: | https://www.electricajournal.org/index.php/pub/article/view/316 |
| Ngā Tūtohu: |
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
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