STATISTICAL INVESTIGATION OF SYMMETRICAL CMOS OTA DEGRADATION
In this paper, symmetrical CMOS OTA degradation is investigated with using statistical methods. OTA’ s are degraded using 4155 parameter analyzer and output current change is observed. An appopriate fitting curve is realised with MATLAB programme by taking into consedaration the error. Lifetime of t...
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| Hlavní autoři: | , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
İstanbul University-Cerrahpasa
2008-03-01
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| Edice: | Electrica |
| Témata: | |
| On-line přístup: | https://www.electricajournal.org/index.php/pub/article/view/316 |
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