Control charts using half-normal and half-exponential power distributions using repetitive sampling
Abstract This manuscript presents the development of an attribute control chart (ACC) designed to monitor the number of defective items in manufacturing processes. The charts are specifically tailored using time-truncated life test (TTLT) for two lifetime data distributions: the half-normal distribu...
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| Principais autores: | , , , , , |
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| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
Nature Portfolio
2024-01-01
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| Serier: | Scientific Reports |
| Online adgang: | https://doi.org/10.1038/s41598-023-50137-w |
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