Alternative Methods to Enhance the Axial Resolution of Total Internal Reflection Fluorescence–Structured Illumination Microscopy

Total internal reflection fluorescence–structured illumination microscopy (TIRF-SIM) can enhance the lateral resolution of fluorescence microscopy to twice the diffraction limit, enabling subtler observations of activity in subcellular life. However, the lack of an axial resolution makes it difficul...

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Detalhes bibliográficos

Principais autores:	Xiu Zheng, Xiaomian Cai, Wenjie Liu, Youhua Chen, Cuifang Kuang
Formato:	Artigo
Idioma:	Inglês
Publicado em:	MDPI AG 2025-06-01
Colecção:	Photonics
Assuntos:	total internal reflection fluorescence microscopy structured illumination microscopy axial resolution enhancement three-dimensional super-resolution
Acesso em linha:	https://www.mdpi.com/2304-6732/12/7/652
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