Alternative Methods to Enhance the Axial Resolution of Total Internal Reflection Fluorescence–Structured Illumination Microscopy
Total internal reflection fluorescence–structured illumination microscopy (TIRF-SIM) can enhance the lateral resolution of fluorescence microscopy to twice the diffraction limit, enabling subtler observations of activity in subcellular life. However, the lack of an axial resolution makes it difficul...
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| Autors principals: | , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
MDPI AG
2025-06-01
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| Col·lecció: | Photonics |
| Matèries: | |
| Accés en línia: | https://www.mdpi.com/2304-6732/12/7/652 |
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