Uncertainty Assessment Framework for IGBT Lifetime Models. A Case Study of Solder-Free Modules

Insulated gate bipolar transistors (IGBTs) are ubiquitous semiconductor devices used in diverse electronic power applications. The reliability and lifetime assessment of IGBTs is intricate and influenced by different ageing processes. One of the main ageing mechanisms is the bond wire lift-off failu...

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Principais autores:	Ander Zubizarreta, Markel Penalba, David Garrido, Unai Markina, Xabier Ibarrola, Jose Aizpurua
פורמט:	Artigo
שפה:	Inglês
יצא לאור:	The Prognostics and Health Management Society 2024-12-01
סדרה:	International Journal of Prognostics and Health Management
נושאים:	semiconductor lifetime igbt uncertainty reliability condition monitoring
גישה מקוונת:	https://papers.phmsociety.org/index.php/ijphm/article/view/4164
תגים:	הוספת תג אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!