Uncertainty Assessment Framework for IGBT Lifetime Models. A Case Study of Solder-Free Modules
Insulated gate bipolar transistors (IGBTs) are ubiquitous semiconductor devices used in diverse electronic power applications. The reliability and lifetime assessment of IGBTs is intricate and influenced by different ageing processes. One of the main ageing mechanisms is the bond wire lift-off failu...
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| Autors principals: | , , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
The Prognostics and Health Management Society
2024-12-01
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| Col·lecció: | International Journal of Prognostics and Health Management |
| Matèries: | |
| Accés en línia: | https://papers.phmsociety.org/index.php/ijphm/article/view/4164 |
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