Combinatorial Screening for Europium Induced Defect Engineering in Titania Anodic Memristors
ABSTRACT A Ti‐Eu thin film combinatorial library with a composition ranging from 3 to 17 at.% Eu is fabricated by co‐sputtering and followed by anodic oxidation. Systematic screening of the electrical behaviour of the resulting anodic memristors revealed forming‐free, analogue switching behaviour, w...
Furkejuvvon:
| Váldodahkkit: | , , , , , |
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| Materiálatiipa: | Artigo |
| Giella: | Inglês |
| Almmustuhtton: |
Wiley-VCH
2026-02-01
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| Ráidu: | Advanced Materials Interfaces |
| Fáttát: | |
| Liŋkkat: | https://doi.org/10.1002/admi.202500883 |
| Fáddágilkorat: |
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