Combinatorial Screening for Europium Induced Defect Engineering in Titania Anodic Memristors
ABSTRACT A Ti‐Eu thin film combinatorial library with a composition ranging from 3 to 17 at.% Eu is fabricated by co‐sputtering and followed by anodic oxidation. Systematic screening of the electrical behaviour of the resulting anodic memristors revealed forming‐free, analogue switching behaviour, w...
Сохранить в:
| Главные авторы: | , , , , , |
|---|---|
| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
Wiley-VCH
2026-02-01
|
| Серии: | Advanced Materials Interfaces |
| Предметы: | |
| Online-ссылка: | https://doi.org/10.1002/admi.202500883 |
| Метки: |
Нет меток, Требуется 1-ая метка записи!
|