Advances in Mechanical Testing of Thin Films
This paper reviews techniques for the measurement of basic mechanical properties of thin films with thicknesses ranging from monoatomic layers to micrometres. The challenge of characterising thin films lies in the limitations of conventional techniques, which are typically designed for bulk material...
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| Autor principal: | |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
G. V. Kurdyumov Institute for Metal Physics of the N.A.S. of Ukraine
2025-12-01
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| Col·lecció: | Успехи физики металлов |
| Matèries: | |
| Accés en línia: | https://ufm.imp.kiev.ua/en/abstract/v26/i04/968.html |
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