Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor
Insulated-gate bipolar transistors (IGBTs) are one of the most vulnerable components that account for a significant fraction of inverter and converter failures. This paper conducts a degradation analysis of IGBTs using run-to-failure measurements. Online assessment of the degradation state of IGBTs...
Gorde:
| Egile Nagusiak: | , , , , |
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| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
IEEE
2020-01-01
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| Saila: | IEEE Access |
| Gaiak: | |
| Sarrera elektronikoa: | https://ieeexplore.ieee.org/document/9050802/ |
| Etiketak: |
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