Improvement of Optical-Induced Thermography Defect Detectability by Equivalent Heating and Non-Uniformity Compensation in Polyetheretherketone
This paper deals with the experimental procedures of lock-in thermography (LIT) for polyetheretherketone (PEEK), which is used as a lightweight material in various industrial fields. The LIT has limitations due to non-uniform heating by external optic sources and the non-uniformity correction (NUC)...
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| Hauptverfasser: | , , , , |
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| Format: | Artigo |
| Sprache: | Inglês |
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MDPI AG
2024-09-01
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| Schriftenreihe: | Applied Sciences |
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| Online-Zugang: | https://www.mdpi.com/2076-3417/14/19/8720 |
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