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Improvement of Optical-Induced Thermography Defect Detectability by Equivalent Heating and Non-Uniformity Compensation in Polyetheretherketone

This paper deals with the experimental procedures of lock-in thermography (LIT) for polyetheretherketone (PEEK), which is used as a lightweight material in various industrial fields. The LIT has limitations due to non-uniform heating by external optic sources and the non-uniformity correction (NUC)...

Disgrifiad llawn

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Prif Awduron: Yoonjae Chung, Chunyoung Kim, Seungju Lee, Hyunkyu Suh, Wontae Kim
Fformat: Artigo
Iaith:Inglês
Cyhoeddwyd: MDPI AG 2024-09-01
Cyfres:Applied Sciences
Pynciau:
Mynediad Ar-lein:https://www.mdpi.com/2076-3417/14/19/8720
Tagiau: Ychwanegu Tag
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