Ellipsometric studies of (Cu6PS5I)1-x(Cu7PS6)x and (Cu6PS5Br)1-x(Cu7PS6)x mixed crystals
(Cu6PS5I)1–x(Cu7PS6)x and (Cu6PS5Br)1–x(Cu7PS6)x mixed crystals were grown using a direct crystallization technique from the melt. Refractive indices and extinction coefficients for mixed crystals were obtained from the spectral ellipsometry measurements. A nonlinear increase of the refractive indic...
Збережено в:
| Автор: | |
|---|---|
| Формат: | Artigo |
| Мова: | Inglês |
| Опубліковано: |
National Academy of Sciences of Ukraine. Institute of Semi conductor physics.
2019-09-01
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| Серія: | Semiconductor Physics, Quantum Electronics & Optoelectronics |
| Предмети: | |
| Онлайн доступ: | http://journal-spqeo.org.ua/n3_2019/P347-352abstr.html |
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